Semiconductor Manufacturing Processes
To offer the measuring solutions for
Semiconductor Manufacturing Processes
Measurement Solutions for Semiconductor Manufacturing Processes
As the semiconductor industry accelerates—driven by shifting production towards electric vehicles, expansion of commercial 5G, and increased data centre growth, high-precision measurement is critical to meet the increasing demand for precise and reliable metrology solutions. Being the market leader in precision measurement, Mitutoyo is ready to support semiconductor manufacturers with advanced precision measurement solutions across every stage of production.
Support & Development and Production of Semiconductor Manufacturing Processes
by Mitutoyo Measuring Equipments
Mitutoyo ensures accurate semiconductor measurement through precision solutions and robust industrial metrology systems, further strengthened by large-scale measurement services to support high-volume inspection—helping manufacturers achieve higher yields, improved reliability, and sustained competitiveness.
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Mitutoyo offers comprehensive metrology solutions designed to meet the stringent accuracy and repeatability requirements of semiconductor manufacturing. Our portfolio includes non-contact vision measuring solutions for automated probe card inspections to ensure probe card alignment, flatness, and wear are precisely controlled to maintain wafer testing accuracy. This improves inspection efficiency while reducing downtime and manual intervention.
Featured Measuring Product:
Quick Vision Apex Pro
- Preventing nonconformities during mass production
- 3D measurement with multiple sensors
- Flaw Inspection Software DDPAK-QV
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For packaging and assembly processes, Mitutoyo provides reliable lead frame production inspection solutions to verify dimensional accuracy and structural integrity. These lead frame production inspection solutions help manufacturers maintain consistent quality and reduce defects in production environments.
Featured Measuring Product:
Measuring Microscope
- Ultra-wide View Field and High Magnification Observation
- Excellent usability, a high-NA and long working distance objectives enable effective observation
In addition, Mitutoyo supplies high-performance measuring microscopes for semiconductor measurement applications, enabling detailed inspection of micro-scale features. Each microscope is designed to deliver stable imaging and accurate data for process control and failure analysis.
Featured Measuring Product:
Quick Vision Pro Series with STREAM function
1. Full automation – Continuous and high speed measurement during mass production.
2. Preventing nonconformities during mass production.
3. Unique STREAM function help to significantly reduce measurement cycle time.